• IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System
  • IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System
  • IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System
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IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System

Product Details:

Place of Origin: China
Brand Name: Sinuo
Certification: Calibration Certificate (Cost Additional)
Model Number: SN6613

Payment & Shipping Terms:

Minimum Order Quantity: 1
Price: Customized
Packaging Details: Carton Box
Delivery Time: 30 days
Payment Terms: T/T
Supply Ability: 20 sets/month
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Detail Information

Applied Standard: IEC 61000-4-4 And Etc. Pulse Waveform: 5/50ns, 50Ω And 1000Ω Load
Open Circuit Output Voltage: 0.25-6kV ±5% 50Ω Load Output Voltage: 0.125-3kV ±5%
Source Impedance: 50Ω ±20% Burst Period: 100-999ms
Trigger Mode: Synchronous Or Asynchronous Warranty Term: One Year
High Light:

IEC 61000 4 4 electrical fast transient

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EFT electrical fast transient

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EFT Generator

Product Description

  
 

IEC 61000-4-4 Electrical Fast Transient EFT Generator


Complied Standards & Clauses


IEC 61000-4-4/ GB/T17626.4:Electrical fast transient immunity test


Equipment Overview


Samples and Resrictions: Industrial controllers, home appliances, medical electronics, communication electronics, components, automative controllers, etc.

 

Application: Intended to demonstrate the immunity of electrical and electronic equipment when subjected to types of transient disturbances such as those originating from switching transients (interruption of inductive loads, relay contact bounce, etc.)
 

Test Principle: 

Burst immunity test is the interference generated by many mechanical switches in the simulation grid when switching inductive load. These types of disturbances are characterized by narrow clusters of pulses with high pulse repetition rates (kHz-MHz), steep rising edges (ns), short durations of individual pulses (10-100 ns) with amplitudes up to kV level. Narrow pulses in clusters can charge the junction capacitance of the semiconductor device, which can cause a line or device error when energy accumulates to a certain degree. During the test, a pulse is superimposed on the power supply line (via the coupling / decoupling network) and the communication line (via the capacitive coupling clip) to interfere with the device. The experimental part of the EUT mainly includes the power supply port, PE, signal and control port of the equipment.

 

Structure: 

7-inch touch LCD interface, rich in functions, easy for operation and upgrading software

User-programmable test program with up to 1000 sets of memory

Built-in three-phase five-wire 16A power network, network and host 2 in 1, miniaturized design

Imported non-inductive high-power resistors are used in the pulse forming circuit to ensure stable pulse waveforms

The coupling network uses the latest optimization technology, with low attenuation and sufficient output energy.

Built-in temperature and humidity sensor for real-time monitoring of the experimental environment

EUT output comes with high-strength industrial-grade standard sockets, which is more convenient and reliable.

Intelligent program-controlled high voltage power supply with built-in high voltage overvoltage, overcurrent and short circuit protections

Self-diagnosis function, intelligent judgment of high voltage, abnormal pulse output

 

Technical Parameters


Control & Operation Electrical control and touch screen intelligent operating system
Open Circuit Output Voltage 0.25-6kV ±5%
50Ω Load Output Voltage 0.125-3kV ±5%
Pulse Waveform 5/50ns, 50Ω and 1000Ω load
Rise Time tr 5ns ±30%, 50Ω load
5ns ±30%, 1000Ω load
Pulse Duration td 50ns ±30%, 50Ω load
50ns -15/+100sn, 1000Ω load
Source Impedance 50Ω ±20%
Output Polarity Positive, negative, positive and negative cycles, positive and negative alternating, first positive and then negative, first negative and then positive
Pulse Repetition Frequency 0.1-1200.0kHz ±10%
Burst Length Standard: 15ms@2.5kHz/5kHz, 750μs@100kHz, 250μs@300kHz

Adjustable: the number of pulses can be selected from 1 to 255

Burst length = (number of pulses - 1) / pulse repetition frequency

Burst Period 100-999ms
Trigger Mode Synchronous or asynchronous
Synchronous Phase Free setting 0-360°, resolution 1°
Programmable Test Program Built-in IEC standard and user-defined programs, up to 1000 groups

Built-in Network Capacity

(three phases and five lines)

AC, three-phase 380V, 16A (Max), 50/60Hz
DC, 380V, 16A (Max)
Built-in Network Coupling Method L1, L2, L3, N, PE, can be combined
Built-in Network Coupling Device 33nF ±10% capacitive coupling
Use environment Temperature: 15 ° C -35 ° C, relative humidity: 10% -75%
System Power AC220±10%, 50/60Hz, about 300W
Dimensions W 470mm * H 215mm * D 500mm
Weight About 25kg
 

Waveform Diagram


 

IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System 0

IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System 1

 

Measured Waveform


 

IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System 2IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System 3

The waveforms can be checked with an external oscilloscope

 

Test Configuration Layout


 

IEC 61000 4 4 Electrical Fast Transient EFT Generator Intelligent Operating System 4

Other equipments in this layout are optional

 

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