IEC 62916-2 Short-time Test Current And Temperature Rising Test System

IEC 62916-2 Short-time Test Current and Temperature Rising Test System

Complied Standards & Clauses

This test system meets the standard requirements of IEC 62196-1Ed.4CDV 2020 clause 12.3, clause 24, table 10, clause 34.2, 34.4 and 35.4., IEC 62916-2, IEC 62916-3, etc.

Product Overview

It is suitable for detecting the temperature rise test after the EV plug and socket pass the rated current, and assessing the heating of the surface of the electrical accessories when the load current is connected, and whether the temperature rise of the terminal meets the requirements of the standard. Also used for short-time high current withstand test for grounding contacts.

Equipment Features
The system uses self-programmed software controlled by a computer. All standard test procedures and data judgments are controlled by the system, making operation easy. It is used to assess the surface heating and electrode temperature rise of charging interfaces and electrical accessories when connected to load current, and to check if the temperature rise meets the standard requirements.

Technical Parameters

Temperature Rise Testing (Built-in Temperature Inspection Device):

• Temperature Measurement Range: 0–260°C, Accuracy: ±0.3% of reading + 1°C; Resolution: 0.1°C
• Temperature Measurement Points: 16 channels (including 1 point for measuring ambient temperature)
• Thermocouple Types Supported: The instrument supports J, K, T, E, S, N, B, R types of thermocouples.
• Thermocouple Used for Measurement: USA Ω Company K-type 30AWG fine wire thermocouples, length 2 meters, 20 pieces in total.
• Temperature Probes: The temperature probes can perform live testing without damaging the instrument.
• Temperature Scanning Speed & Recording Interval: 0.1–1800 seconds for all channels.
• Temperature Data Recording: Automatically completed by the computer, with configuration for computer test software.
• The software can set an ambient temperature channel, and automatically subtract the ambient temperature during data collection.