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EV Connector Testing Equipment
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IEC 60529 IP2X Test Probe B Live Contact Safety Test Probe For Electrical Products

IEC 60529 IP2X Test Probe B Live Contact Safety Test Probe For Electrical Products

Brand Name: Sinuo
Model Number: SN2210-2T
MOQ: 1
Price: Customized
Payment Terms: T/T
Supply Ability: 10 Sets Per Month
Detail Information
Place of Origin:
China
Certification:
Calibration Certificate (Cost Additional)
Finger Length:
80±0.2 (mm)
Fingertip To Baffle:
180±0.2 (mm)
Cylindrical:
R2±0.05 (mm)
Baffle Diameter:
Ф75±0.2(mm)
Baffle Thickness:
5±0.5(mm)
Built-in Force:
0-50N Force, Resolution Of 5N
Packaging Details:
Plywood
Supply Ability:
10 Sets Per Month
Product Description
IEC 60529 IP2X Test Probe B Live Contact Safety Test Probe For Electrical Products

Product Information

This precision test finger is manufactured to match Test Probe B defined in Figure 2 of IEC 61032. It is a mandatory test apparatus specified under IEC 60529 IP2X, IEC 60950 Figure 2A, IEC 60884 and other relevant international standards.

The probe is designed to verify the basic barrier performance that blocks human fingers from reaching internal hazardous components. Constructed with fingertip segment, finger body, base and insulated grip, it accurately replicates the physical features of a human finger. Equipped with two flexible articulating joints, the probe can bend up to 90 degrees to simulate real finger movement.

Fitted with an optional alligator clip, it supports live contact safety verification. An M6 internal threaded hole at the end of the handle allows connection to an external push-pull force gauge to deliver controlled test load for enclosure barrier assessment (force gauge to be supplied separately by the user).

IEC 60529 IP2X Test Probe B Live Contact Safety Test Probe For Electrical Products 0
Technical Parameters
Parameters /Model SN2210-2T
Name Standard test finger with force
Joint 1 30±0.2 (mm)
Joint 2 60±0.2 (mm)
Finger length 80±0.2 (mm)
Fingertip to baffle 180±0.2 (mm)
Cylindrical R2±0.05 (mm)
Spherical S4±0.05 (mm)
Fingertip cutting bevel angle 37o 0 -10’
Fingertip taper 14o 0 -10’
Test finger diameter Ф12 0-0.05 (mm)
A-A Section diameter Ф50(mm)
A-A Section width 20±0.2
Baffle diameter Ф75±0.2(mm)
Baffle thickness 5±0.5(mm)
Built-in force 0-50N force, resolution of 5N
Advantages of 50N Test Probe B

Our articulated Test Probe B is a core standard testing instrument fully aligned with IEC 61032 Figure 2, widely demanded for IP2X protection and safety certification across multiple industrial sectors. Featuring dual 90° bendable joints that perfectly replicate human finger shapes and movements, it delivers highly accurate enclosure barrier detection results to check whether product housings can stop finger access to internal hazardous components.

This multi-functional test finger fits diverse testing scenarios: household electrical appliances, IT & communication power equipment, plug & socket accessories, audio-visual products, and low-voltage electrical components. It supports two extended test modes: pairing with an alligator clip for live contact safety verification, and connecting an external push-pull force gauge via the M6 threaded hole for load-bearing enclosure strength inspection.

Adopting this precision probe unifies your lab testing standards to meet IEC 60529, IEC 60950, IEC 60884 and other global regulatory requirements, greatly simplifying CE and international safety audit processes for your products. Its standardized dimensional accuracy and durable insulated structure guarantee stable, repeatable testing for both laboratory R&D verification and factory mass batch inspection.